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ABSTRACT:
Silicon nitride (Si3N4) metal-insulator-metal (MIM) modelling at preliminary stage based on High Electron Mobility Transistor (HEMTS) on Gallium Arsenide (GaAs) substrates are presented. Device measurement and simulation of the Si3N4 MIM capacitor is performed in the frequency range of 2 to 50 GHz to generate S-parameters data. The behaviour of the capacitor as a function of the operating frequencies is studied. The equivalent circuit of Si3N4 MIM capacitor is proposed representing the behaviour of the devices.
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STATISTICS
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