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Time for the changing of the guard: A farewell to short forms of intelligence tests.

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CONTRIBUTORS:
  Author Kaufman, James C (California State University San Bernardino)
  Author Kaufman, Alan S
JOURNAL:
  Journal of Psychoeducational Assessment, 19(3), 245 - 267.
YEAR: 2001
PUB TYPE: Journal Article
SUBJECT(S): None
DISCIPLINE: Psychology
HTTP:
LANGUAGE: English
PUB ID: 103-383-461 (Last edited on 2002/10/16 17:11:38 GMT-6)
SPONSOR(S):
 
ABSTRACT:
The development of short forms of intelligence tests, especially of Wechsler's scales, has been pastime of researchers and clinicians for decades. These short forms have usually been of the 2- or 4-subtest variety, but other variants such as Satz-Mogel split-half short form have also been common. The literature is replete with proposed short forms and with controversies over their proper use, the statistical problems associated with validity coefficients when the short-form data are obtained from a complete administration of the test battery, and the logic of choosing subtests that are long to administer and score in view of the goal to reduce time. This article argues that the time has come to abandon short forms of intelligence tests in favor of brief tests such as the Kaufman Brief Intelligence Test (K-BIT), the Wechsler Abbreviated Scale of Intelligence (WASI), and the Wide Range Intelligence Test (WRIT), which are reliable, valid, well normed, and easy both to give and score.
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