|
PUBLICATIONS
|
 |
Bibliographies
|
 |
0
|
 |
 |
Book chapters
|
 |
0
|
 |
 |
Book reviews
|
 |
0
|
 |
 |
Books
|
 |
0
|
 |
 |
Books, edited
|
 |
0
|
 |
 |
Conf. papers
|
 |
0
|
 |
 |
Conf. presentations
|
 |
0
|
 |
 |
Conferences
|
 |
0
|
 |
 |
Discussion groups
|
 |
0
|
 |
 |
Grants
|
 |
0
|
 |
 |
Journal articles
|
 |
0
|
 |
 |
Periodicals/series
|
 |
0
|
 |
 |
Proceedings
|
 |
0
|
 |
 |
Proceedings, papers
|
 |
0
|
 |
 |
Reports
|
 |
0
|
 |
 |
Special issues
|
 |
0
|
 |
 |
Theses
|
 |
0
|
 |
 |
Treaties
|
 |
0
|
 |
 |
Working papers
|
 |
0
|
 |
|

|
STATISTICS
|
 |
Citation Rank
|
 |
|
 |
 |
Total Citations
|
 |
0 |
 |
 |
Publications
|
 |
0 |
 |
 |
Rank
|
 |
325052 |
 |
 |
Viewers
|
 |
5 |
 |
 |
Views
|
 |
1361 |
 |
|
|
 |
 |
Dr. Xiaoling Sun
(b. ----,
d. ----)
|
( Prev | Next )
|
 |
|
|
|
POSITION(S) / JOB TITLE(S):
|
|
Associate Professor |
|
|
Main research interest is in design and testing of very large scale integrated (VLSI) circuits, computer memories, field programmable logic devices (FPLDs), and system-on-chips (SoCs). It involves developing design for testability (DFT) methods, built-in self test (BIST) strategies and testing algorithms to make VLSI circuits testable, reliable, and the testing economical. As semiconductor process technology quickly moves towards very deep submicron technology, the testing of ICs and systems becomes an increasingly difficult task. |
|
|
Associate Professor |
|
Engineering |
|
University of Alberta |
|
|
Only Visible to Members of getCITED
|
|
|
Doctorate
|
|
|
Unknown
|
|
|
Female / English
|
|
|
Unknown |
|
|
1107-5321
(Last changed on
2003/09/10 16:53:32)
|
|
  |
|
|
|
|