Spector et al. (2002) The pitfalls of poor psychometric properties: A rejoinder to Hofstede's reply to us

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The pitfalls of poor psychometric properties: A rejoinder to Hofstede's reply to us

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CONTRIBUTORS:

	Author:	Spector, P. E.
	Author:	Cooper, C. L.
	Author:	Sanchez, J. I.
	Author:	Sparks, K.
	Author:	Bussing, A.
	Author:	Dewe, P.
	Author:	Lu, L.
	Author:	Miller, K.
	Author:	De Moraes, L. R.
	Author:	O'Driscoll, M.
	Author:	Pagon, M. (Middle East Technical University, Northern Cyprus Campus)
	Author:	Pitariu, H.
	Author:	Poelmans, S.
	Author:	Radhakrishnan, P.
	Author:	Salgado, J.
	Author:	Siu, O. L.
	Author:	Stora, J. B.
	Author:	Vlerick, P.
	Author:	Westman, M.
	Author:	Widerszal-Bazyl, M.
	Author:	Wong, P.

JOURNAL:

Applied psychology: Psychologie appliqu�e, 51(1), 174 - 178.

YEAR:

2002

PUB TYPE:

Journal Article

SUBJECT(S):

Psychometrics, values, Hofstede

DISCIPLINE:

Psychology

HTTP:

LANGUAGE:

English

PUB ID:

103-439-484 (Last edited on 2007/12/30 13:55:36 US/Mountain)

SPONSOR(S):

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